ULTRAMICROSCOPY

Time-of-flight secondary ion mass spectrometry in the helium ion microscope.

Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes.

Novel remapping approach for HR-EBSD based on demons registration.

Tip wear and tip breakage in high-speed atomic force microscopes.

Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross correlation on the sphere.

Extending ζ-factor microanalysis to boron-rich ceramics: Quantification of bulk stoichiometry and grain boundary composition.

Estimation of elastic strain by integrated image correlation on electron diffraction patterns.

Magnetic measurement by electron magnetic circular dichroism in the transmission electron microscope.

The maximum a posteriori probability rule for atom column detection from HAADF STEM images.

Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteries.

The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials.

Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy.

Depth-profiling of nickel nanocrystal populations in a borosilicate glass - A combined TEM and XRM study.

On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium.

Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy.

Capabilities of the Falcon III detector for single-particle structure determination.

Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors.

Conduction mechanisms and voltage drop during field electron emission from diamond needles.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction.

Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations.

Phase retrieval with extended field of view based on continuous phase modulation.

Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1\u202feV landing energy.

Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum.

Towards large scale orientation mapping using the eCHORD method.

Prospects of annular differential phase contrast applied for optical sectioning in STEM.

Disentangling topographic contributions to near-field scanning microwave microscopy images.

Pulse picking in synchrotron-based XPEEM.

Extremely low count detection for EELS spectrum imaging by reducing CCD read-out noise.

A 0.5-T pure-in-plane-field magnetizing holder for in-situ Lorentz microscopy.

Influence of pixelization on height measurement in atomic force microscopy.

A comparison of two high spatial resolution imaging techniques for determining carbide precipitate type and size in ferritic 9Cr-1Mo steel.

Continued skirmishing on the wave-particle frontier.

The design and the performance of an ultrahigh vacuum 3He fridge-based scanning tunneling microscope with a double deck sample stage for in-situ tip treatment.

The mechanism of nanoparticle precipitation induced by electron irradiation in transmission electron microscopy.

Mesoscopic quantitative chemical analyses using STEM-EDX in current and next generation polycrystalline Ni-based superalloys.

Design for a high resolution electron energy loss microscope.

Observation of surface step bunch induced perpendicular magnetic anisotropy using spin-polarized low energy electron microscopy.

Design and application of a relativistic Kramers-Kronig analysis algorithm.

Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductors.

On the residual six-fold astigmatism in DCOR/ASCOR.

Multi-modal and multi-scale non-local means method to analyze spectroscopic datasets.

Geometry determination and refinement in the rotation electron diffraction technique.

Correlative study of lattice imperfections in long-range ordered, nano-scale domains in a Fe-Co-Mo alloy.

Longevity in electron optics- Introduction to the Howie-Colliex-Lichte birthday issue.

Beam brightness and its reduction in a 1.2-MV cold field-emission transmission electron microscope.

Data-driven computational method for determining accurate analytical field solutions on arbitrary-geometry spectrometers.

Fluctuations of focused electron beam in a conventional SEM.